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Ni-Cr based super-alloys have exceptional corrosion resistance, which is further improved with Mo alloying. The correlation between passive layer performance and composition was studied to gain a deeper mechanistic understanding of the role of Mo by comparing the behavior of Ni-22Cr to Ni-22Cr-6Mo (wt%) alloys. The passive layers were formed using galvanostatic holds to create fast and slow growth conditions using high and low current densities. A potentiostatic hold was added to initiate exposure aging. The passive film was characterized using electrochemical impedance spectroscopy (EIS), linear sweep voltammetry (LSV), atomic emission spectro-electrochemistry (AESEC), and X-ray photoelectron spectroscopy (XPS). Combined electrochemical and XPS characterization offered insight in cation concentrations and stratification, bonding states (oxide, hydroxide), and their modulation as a function of electrochemical conditions and performance. Most importantly: (i) Mo addition enhanced Cr(III) bound in oxide, (ii) fast growth conditions resulted in less corrosion resistant films, and (iii) exposure aging increased Cr-enrichment and reduced stratification of Mo-cations. The correlation between passive film performance and Cr, Ni, and Mo oxidation states, bonding, oxide-hydroxide contributions, and stratification is discussed. Generally accepted correlations, such as Cr-cation concentration and performance of the passive layer, have to be reexamined in order to account for the complex chemical make-up of the passive layer. 

The impact of the high-power impulse magnetron sputtering (HiPIMS) pulse width on the crystallization, microstructure, and ferroelectric properties of undoped HfO2 films is investigated. HfO2 films were sputtered from a hafnium metal target in an Ar/O2 atmosphere, varying the instantaneous power density by changing the HiPIMS pulse width with fixed time-averaged power and pulse frequency. The pulse width is shown to affect the ion-to-neutral ratio in the depositing species with the shortest pulse durations leading to the highest ion fraction. In situ x-ray diffraction measurements during crystallization demonstrate that the HiPIMS pulse width impacts nucleation and phase formation, with an intermediate pulse width of 110 μs stabilizing the ferroelectric phase over the widest temperature range. Although the pulse width impacts the grain size with the lowest pulse width resulting in the largest grain size, the grain size does not strongly correlate with the phase content or ferroelectric behavior in these films. These results suggest that precise control over the energetics of the depositing species may be beneficial for forming the ferroelectric phase in this material.